Nikon Epiphot 200 Inverted Metallograph Microscopes

Nikon Updated: 2007-06-19
Nikon Epiphot 200 Inverted Metallograph Microscopes

Affordable inverted metallograph in a compact and upgradable package.

The well equipped Epiphot 200 has many of the outstanding features of the Epiphot 300, in a more compact and upgradable package. It is the instrument of choice for those whose primary focus is observation and projecting the results onto a monitor. Photomicrographic capability is just one of the many options available for this versatile instrument.

CF Infinity Corrected Optical System
An ideal optical system which combines Nikon's renowned CF Optics with Infinity Corrected design for even greater system flexibility. The result is sharp and clear images you can depend on.

Reticle Imprinting Option
Because the reticle is inserted at the primary image plane position, the micrometer maintains fine focus without being affected by the state of the sample surface being observed. Austenite reticles and grids can also be imprinted.

Operator-friendly Design
A lowered stage design (75mm/2.9 in. lower than the previous model) and controls conveniently located within easy reach greatly facilitate overall operation, as does the built-in interlocking aperture diaphragm which automatically adjusts during darkfield/brightfield changeover, and the universal joint stage handle which allows quick movement of the stage by hand from a fixed position.

Stable and Reliable
Front and rear support of the stage, a low profile design, and a nosepiece focusing system, all make for a super stable, extremely rugged instrument.

Brightfield Observation
This is the most frequently used observation method and uses differences in reflection to obtain the natural color and shape of a sample.

Nomarski DIC Observation
This observation method can capture subtle irregularities and flaws as interference colors and indicate them in three-dimensional forms. Thanks to its ability to represent very small tilt (differential coefficient) with sharp differential contrast, this observation method can detect minute differences in height.

Darkfield Observation
This observation method is significant for observing and photomicrographing minute flaws, surface irregularities, differences in level, or samples with low reflection rates, all difficult to observe under brightfield observation.

Simple Polarization Observation
Used to analyze specific optical characteristics such as isotropy and anisotropy, this observation method permits observation with polarized contrast by way of inteference colors. Ideal for observing crystal conditions and detecting stress such as metal fatigue.

Epi-Fluorescence Observation
This observation method detects substances on a specimen in the form of fluorescent images and is effective in identifying them.