Nikon ECLIPSE L200D IC Inspection Microscope

Nikon Updated: 2008-04-14 RSS
Nikon ECLIPSE L200D IC Inspection Microscope

ECLIPSE L200D for Diascopic Brightfield, Episcopic Darkfield, and DIC Observations

Incorporating the CFI60 optical system boasting optical performance at the world's highest level, it minimizes flare to deliver high contrast.

• New objectives with a 60mm parfocal distance provide both high NA’s and long working distances

• Complete anti-contamination design

• Brightfield and darkfield illuminators built in

For diascopic brightfield, episcopic darkfield, and DIC observations

• Supports both diascopic and episcopic illuminations

• Nomarski prism in the nosepiece supports all objectives—Single DIC system—to produce DIC images with minimum deviation in color density