Nikon ECLIPSE L200A Automated IC Inspection Microscope for Brightfield Observation

Nikon Updated: 2008-04-14 RSS
Nikon ECLIPSE L200A Automated IC Inspection Microscope for Brightfield Observation

Major operations of the L200A are motorized and can be preset for instant recall. This eliminates deviations in inspection results and enables the standardization of inspection. Moreover, it features not only performance at the world's highest level, but also the flexibility to accept various accessories according to application.

• Major operations such as focusing, aperture and light intensity control are motorized

• Most advanced CFI60 optical system

• Flare is minimized for high contrast

• New objectives with a 60mm parfocal distance provide both high NA’s and long working distances

• Complete anti-contamination design

For brightfield observation

• Dedicated to brightfield observation