Hitachi S-4300 SE/N Variable Pressure Field Emission Scanning Electron Microscope

* Thermal Field Emission SEM with Variable Pressure Technology

* Environmental Secondary Electron Detector (ESED) Option

* Analytical Chamber Available for Simultaneous CL, EDX, WDS and EBSD Analysis

* High Resolution Observation of Wet, Oily, Dirty or Non-Conductive Samples

* Ideal for Dynamic Experiments

The S-4300SE/N combines the benefits of a Schottky Field Emission gun, Variable Pressure technology and Hitachi's ESED imaging capability. When operating in Variable Pressure mode, the S-4300SE/N provides high-resolution images of all types of insulating materials or biological samples. The S-4300SE/N's optional chamber design provides a superior analytical configuration to optimize the performance of CL, EDX, WDS, and EBSD applications. High current and stability make the S-4300SE/N ideal for Electron Beam Lithography and other dynamic experiments.

System Specifications

Secondary Electron Image Resolution: 1.5nm @ 30kV
Electron Gun : Schottky Field Emission
Specimen Size : 160mm with Large Eucentric Stage