Hitachi S-4300 SE Analytical Schottky Field Emission Scanning Electron Microscope
Hitachi Updated: 2009-03-28 RSS* High probe current and high beam stability
* High resolution imaging
* Suitable for various analytical applications
* Integrated Robinson backscattered electron detector
* PCI image data management software
The S-4300SE is a high resolution Analytical Schottky Emission SEM (SESEM) that suits the needs of users in material and life sciences as well as semiconductor disciplines. It has been designed for applications that require:
1) high source brightness
2) high probe current
3) both short and long-term beam stability
4) high resolution imaging.
The S-4300SE can be fully integrated with various optional accessories including Cathode Luminescence (CL), Electron Backscattered Diffraction Pattern (EBSP), Energy Dispersive X-ray Spectrometer (EDX) and Electron Beam Lithography (EB).
System Specifications
Secondary Electron Image Resolution: 1.5nm (at 30kV) in customer's lab
5.0nm (at 1kV) in customer's lab
Electron Gun: ZrO/W Schottky Emission Source
Specimen Size: 160mm diameter
No manuals currently available for this model.
Related Manuals
Hitachi S-4300 Cold Field Emission Scanning Electron Microscope
Hitachi S-5500 In-Lens Field Emission Scanning Electron Microscope
Hitachi S-4800 UHR Field Emission Scanning Electron Microscope
Hitachi SU-70 UHR Schottky Field Emission Scanning Electron Microscope
Hitachi FB-2100 Focused Ion Beam System
Hitachi CG4000 Scanning Electron Microscope
Olympus NanoZoomer RS Digital Pathology System
Olympus FSX100 Bio Imaging Navigator
Olympus Fluoview FV1000MPE TWIN Multiphoton Laser Scanning Microscope
Olympus Fluoview FV1000MPE SIM Multiphoton Laser Scanning Microscope
Olympus Fluoview FV1000MPE Basic Multiphoton Laser Scanning Microscope
Olympus FluoView FV10i Self-contained Confocal Laser Scanning Microscope